Electronic structure investigation ofTi3AlC2,Ti3SiC2, andTi3GeC2by soft x-ray emission spectroscopy
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چکیده
منابع مشابه
Electronic structure investigation of MAX- phases by soft x-ray emission spectroscopy
The electronic structure of nanolaminate Ti2AlC and Ti2AlN thin films, so-called MAX-phases, were investigated by soft X-ray emission spectroscopy. These nanolaminated carbide and nitride compounds represent a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft X-ray emission technique is particularly useful for detecting detailed e...
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2005
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.72.245101